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DOI: 10.1021/nl404836p

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Nano Lett., 2015, 15 (8), pp 4942–4947

10.1103/PhysRevB.92.0831301

10.1038/nnano.2014.299

10.1038/nmat4145

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10.1364/AO.54.003051

10.1088/1367-2630/17/4/043009

10.1103/PhysRevA.90.033834 arXiv:1403.6038

DOI: 10.1088/1367-2630/16/8/083033 arXiv:1404.1190

DOI: 10.1063/1.4862749 arXiv:1312.2394

10.1038/NPHYS3411

DOI: 10.1364/OL.40.002393

DOI: 10.1038/NNANO.2015.74

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DOI: 10.1103/PhysRevApplied.2.064011 arXiv:1408.4117

DOI: 10.1103/PhysRevLett.113.263601 arXiv:1409.4069

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Appl. Phys. Lett. 106 (AIP Publishing) 10.1063/1.4922117

Eur. Phys. J. D n°69 p166

Phys. Rev. Applied n°4

Phys. Rev. Letter n°113

Nature Communications n°6

Nature Communication n°6

Nanoscale 7 Issue: 29 PP12307-12311 (ROYAL SOC CHEMISTR)

Physical Review A n°92 (American Physical Society)

Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015, Pages 1549–1553

DOI: 10.1038/srep12160

doi:10.1016/j.jmr.2016.06.017

Nature Photonics 10, 507–511 (2016) doi:10.1038/nphoton.2016.103

Phys. Rev. A 92, 062343 DOI: http://dx.doi.org/10.1103/PhysRevA.92.062343

Phys. Rev. A 91, 062307 DOI: https://doi.org/10.1103/PhysRevA.91.062307

Phys. Rev. A 91, 062306 DOI: https://doi.org/10.1103/PhysRevA.91.062306

Phys. Rev. B 93, 115116 DOI: https://doi.org/10.1103/PhysRevB.93.115116

Phys. Rev. A 93, 032123 DOI: https://doi.org/10.1103/PhysRevA.93.032123

Phys. Rev. B 93, 174104 DOI: https://doi.org/10.1103/PhysRevB.93.174104

Phys. Rev. Lett. 116, 230502 DOI: https://doi.org/10.1103/PhysRevLett.116.230502

Phys. Rev. A 94, 032322 DOI: https://doi.org/10.1103/PhysRevA.94.032322

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Science 351 DOI: http://dx.doi.org/10.1126/science.aad8022

New Journal of Physics 18, 013040 DOI: http://dx.doi.org/10.1088/1367-2630/18/1/013040

Rev. Sci. Instrum. 87, 063703 (2016) DOI: http://dx.doi.org/10.1063/1.4952953

Nature Nanotechnology 11, 677–681 (2016) DOI: http://dx.doi.org/10.1063/1.4941804

New Journal of Physics, Volume 17, November 2015 DOI: http://dx.doi.org/10.1088/1367-2630/17/11/112001

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arXiv:1607.08354 [physics.optics]

Phys. Rev. A 94, 012324 DOI: https://doi.org/10.1103/PhysRevA.94.012324

Phys. Rev. Lett. 116, 230502 DOI: https://doi.org/10.1103/PhysRevLett.116.230502

New Journal of Physics Vol. 18, 013040

Phys. Rev. B 93, 060408(R) DOI: https://doi.org/10.1103/PhysRevB.93.060408

Phys. Rev. A 93, 032133 DOI: https://doi.org/10.1103/PhysRevA.93.032133

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Microelectronics Reliability 55 (2015) 1549-1553 DOI: 10.1016/j.microrel.2015.06.069

Phys. Rev. B 94, 134305 DOI: http://dx.doi.org/10.1103/PhysRevB.94.134305

Phys. Rev. B 94, 094108 DOI: http://dx.doi.org/10.1103/PhysRevB.94.094108

Nature Communications 8, DOI:10.1038/ncomms14701

Science 07 Jul 2017, Vol. 357, Issue 6346, pp. 67-71, DOI: 10.1126/science.aam8697